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Michael LoandFelix Fietkau
0ca6ed4e27
The test mode interface allows controlled execution of chip-level operations such as continuous transmission, reception tests, and register access, which are essential during bring-up, diagnostics, and factory testing. Co-developed-by: Sean Wang <[email protected]> Signed-off-by: Sean Wang <[email protected]> Signed-off-by: Michael Lo <[email protected]> Link: https://patch.msgid.link/[email protected] Signed-off-by: Felix Fietkau <[email protected]>