The test mode interface allows controlled execution of chip-level
operations such as continuous transmission, reception tests, and
register access, which are essential during bring-up, diagnostics,
and factory testing.
Co-developed-by: Sean Wang <[email protected]>
Signed-off-by: Sean Wang <[email protected]>
Signed-off-by: Michael Lo <[email protected]>
Link: https://patch.msgid.link/[email protected]
Signed-off-by: Felix Fietkau <[email protected]>
